Transmission Electron Microscope (TEM) Tecnai™ FEI Company (Thermo Fisher Scientific) Tecnai F30
Basic Information
Name: | Transmission Electron Microscope (TEM) Tecnai™ | |
Manufacturer: | FEI Company (Thermo Fisher Scientific) | |
Model: | Tecnai F30 | |
Facility: | Micro- and Nanostructures | |
Partner: | Leibniz Institute for Solid State and Materials Research (IFW Dresden) |
Description
Operates at 300 kV accelerating voltage and is equipped with:
- Field emission gun (FEG)
- Super-twin alpha objective lens
- Scanning unit (STEM) with bright field (BF), dark field (DF), and high angle annular dark field (HAADF) detector
- Energy dispersive X-ray spectrometer (EDXS) (Edax EDAMIII with super ultra thin window)
- Imaging energy filter (Gatan GIF 200)
- Multiscan CCD camera (Gatan MSC 794)
- Integrated programmable user interface for all components
Link to Further Details
Points of Contact
Dr. Thomas Gemming/ Mrs. B. Präßler-Wüstling (Sec.)
Web:
Email:
Phone:
+49 (0) 351 4659-217
Fax:
+49 (0) 351 4659-452
Notes
Performance of our Tecnai F30:
Specimens: | Thickness 5 - 300 nm, diameter 3 mm |
Holders: | Single tilt low background (+- 40° tilt), double tilt low background, double tilt low background with cooling (liquid N2), double tilt rotation holder, in-situ straining holder, in-situ STM holder |
Resolution: | Point res. 0.19 nm, Information limit 0.12 nm |
Magnification: | 70 x - 18 Mill. x |
STEM: | Resolution 0.2 nm (Mag. up to 230 Mill. x) BF-, DF-, HAADF-detectors |
EDXS: | Lateral resolution < 2 nm. Detection of all chemical elements with Z >= 5 (Bor), detection limit 0.5 %, correctness 20 % |
EELS: | Lateral resolution < 1 nm. Energy resolution < 1 eV. Especially effective for light elements (e.g. B, C, N, O), detection limit very matrix dependent, >= 0.5 %, correctness 30 % |
Energy filtered imaging: | Lateral resolution < 1 nm, energy resolution about 1 eV. |
Images
Last Update
Last updated at: 13 July 2017 at 11:54:15