Focused Ion Beam (FIB) Microscope Carl Zeiss SMT CrossBeam NVision 40
|Name:||Focused Ion Beam (FIB) Microscope|
|Manufacturer:||Carl Zeiss SMT|
|Model:||CrossBeam NVision 40|
|Facility:||Ion Beam Center (IBC)|
|Partner:||Helmholtz-Zentrum Dresden-Rossendorf (HZDR)|
The NVision 40 CrossBeam is a field emission scanning electron microscope (FESEM) combined with a focused ion beam (FIB). It is a high performance instrument designed for microstructural sectioning, imaging and analytical applications.
Link to Further Details
Options of instrument usage
- This instrument can be used with the support of a supervising assistant.
Points of Contact
Last updated at: 17 February 2019 at 19:59:20