Electromigration-robust layout modification using simulation and verification tools
Basic Information
Name: | Electromigration-robust layout modification using simulation and verification tools | |
Facility: | Group for Design of Electronic Systems | |
Partner: | Technische Universität Dresden (TUD) |
Description
*******Deutsch*******
Layout-Anpassung: Nutzung von effektiven Stromdichte-Simulationen für Leiterbahnen und Vias zur Erstellung eines elektromigrationsrobusten Layouts
Link to Further Details
Points of Contact
Prof. Dr.-Ing. habil. Jens Lienig/ Mrs. Diana Rieger (Sec.)
Web:
Email:
Phone:
+49 (0) 351 463-34742
Fax:
+49 (0) 351 463-37183
Last Update
Last updated at: 13 July 2017 at 11:54:16