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Electromigration-robust layout modification using simulation and verification tools

Basic Information

Name: Electromigration-robust layout modification using simulation and verification tools
Facility: Group for Design of Electronic Systems
Partner: Technische Universität Dresden (TUD)

Description

*******Deutsch*******

Layout-Anpassung: Nutzung von effektiven Stromdichte-Simulationen für Leiterbahnen und Vias zur Erstellung eines elektromigrationsrobusten Layouts

Link to Further Details

http://www.ifte.de/english/services/index.html

Points of Contact

Prof. Dr.-Ing. habil. Jens Lienig/ Mrs. Diana Rieger (Sec.)
Email:
Phone:
+49 (0) 351 463-34742
Fax:
+49 (0) 351 463-37183

Last Update

Last updated at: 13 July 2017 at 11:54:16