The FTIR spectrometer analyses structures, bonding relations and sample compositions (ceramics, glasses, plastic materials, semi-conductors) in any combination and any condition (compact solid state, fractured surface, powder, fiber). The device identifies materials, impurities, detects functionalities or determines optical properties (refraction index, extinction coefficient) of films and compact solid states within the ultra-red spectroscopic range.

Service offer

• FTIR spectroscopic and FTIR microscopic investigations of any customer-tailored samples
• development of complex measuring and analysing methods for quality control
• determination of IR optical material functions (dielectric function, refraction index, extinction coefficient) of samples and film systems

• various sample sizes can be investigated
• sample size is dependent on the measuring mode
• no aqueous solutions

FTIR spectrometer Spectrum 2000 with Autoimage Microscope (Perkin Elmer)

• measuring mode: transmission, specular reflection, diffuse reflection, attenuated total reflection (ATR)
• measuring range: 7800 cm^-1 - 400 cm^-1 (1,3 µm - 25 µm)
  measurements in FIR up to 100 cm^-1 (100 µm)
• resolution: starting with 0,5 cm^-1
• accessories for specular reflection incidence angle 10° - 80°, diffuse reflection, ATR crystals ZnSe, Ge, diamond (golden gate)

Microscope

• measuring mode: transmission, specular reflection, attenuated total reflexion (ATR)
• measuring range: 7800 cm^-1 - 600 cm^-1 (1,3 µm - 17 µm)
• resolution: starting with 0,5 cm^-1
• accessories: ATR crystal Ge