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Small Angle X-ray Scattering Diffractor (SAXS) Bruker Corporation Nanostar

Basic Information

Name: Small Angle X-ray Scattering Diffractor (SAXS)
Manufacturer: Bruker Corporation
Model: Nanostar
Facility: Chair of Inorganic Chemistry I (AC1)
Partner: Technische Universität Dresden (TUD)
Partner: Fraunhofer Institute for Material and Beam Technology (IWS)

Short Description

Small Angle X-ray Scattering Diffractor for the characterization of nanostructures ranging from 1 nm to roughly 125 nm, and nanostructured surfaces.

Description

Small Angle X-ray Scattering Diffractor for the  characterization of nanostructures ranging from 1 nm to roughly 125 nm, and nanostructured surfaces. Large sample chamber accommodating a variety of sample holders, sample changer.

 

Radiation:

Cu-Kα1

Detector:

VÅNTEC-2000, large 2-D detector with true photon counting ability.

Link to Further Details

https://www.bruker.com/de/products/x-ray-diffraction-and-elemental-analysis/x-ray-diffraction/nanostar/overview.html

Points of Contact

Prof. Dr. rer. nat. habil. S. Kaskel/ C. Herrmann (Sec.)
Email:
Phone:
+49 351 463-35955
Fax:
+49 351 463-37287

Images

Last Update

Last updated at: 16 May 2018 at 15:54:49