View all instruments of this unit Spectroscopic Ellipsometer SENTECH Instruments GmbH SE850
Basic Information
| Name: | Spectroscopic Ellipsometer | |
| Manufacturer: | SENTECH Instruments GmbH | |
| Model: | SE850 | |
| Facility: | Materials Analysis | |
| Partner: | Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology (FEP) |
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Description
Measure/Resolution:
- Dispersion of n and k, layer thickness
Accessory/Options:
- SpectraRay3; Software
Link to Further Details
Points of Contact
Dr. Olaf Zywitzki
Web:
Phone:
+49 351 2586-180
Fax:
+49 351 258655-180
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
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Spectroscopic Ellipsometer SENTECH SE850 (Quelle: www.fep.fraunhofer.de) |
Last Update
Last updated at: 13 July 2017 at 11:54:12