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View the profile: Materials Analysis

Equipment of Materials Analysis

Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology
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Hitachi High-Tech FE SEM SU8000 (Quelle: www.fep.fraunhofer.de)

Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop)

Manufacturer: Hitachi HTA
Model: SU8000
Facility: Materials Analysis

 
JEOL Cross Section Polisher SM-09010

Ionenpräparations­system Cross Section Polisher

Manufacturer: JEOL GmbH
Model: SM-09010
Facility: Materials Analysis

 

Nanoindenter

Manufacturer: MTS
Model: Nano Indenter XP
Facility: Materials Analysis

 
Spectroscopic Ellipsometer SENTECH SE850 (Quelle: www.fep.fraunhofer.de)

Spectroscopic Ellipsometer

Manufacturer: SENTECH Instruments GmbH
Model: SE850
Facility: Materials Analysis

 
Brochure Glimmentladungsspektrometer HORIBA GD-Profiler 2™ (Quelle: www.horiba.com)

Glimmentladungsspektrometer (GD-OES)

Manufacturer: HORIBA Jobin Yvon GmbH
Model: GD-Profiler 2™
Facility: Materials Analysis

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