View all instruments of this unit X-Ray Diffractometer (XRD) / Röntgendiffraktometer Bruker AXS GmbH D8 ADVANCE
Basic Information
| Name: | X-Ray Diffractometer (XRD) / Röntgendiffraktometer | |
| Manufacturer: | Bruker AXS GmbH | |
| Model: | D8 ADVANCE | |
| Facility: | X-Ray and EUV Optics | |
| Partner: | Fraunhofer Institute for Material and Beam Technology (IWS) |
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Description
Technical data
- X-ray tube (Cu, Mo, Co, ...) with 0.04 x 12 mm2 long-fine focus or 0.4 x 0.4 mm2 point focus
- sample holder: fixed, Ø = 150 mm
- scintillation detector
- beam divergence: Δθ < 0.02 °
- use of Ni/C - Goebel mirror for:
- monochromization and suppression of fluorescence radiation
- suppression of Cu-Kß radiation
- simple adjustment and short measuring times for parallel beam geometry
Application
- X-ray reflectometry at thin layer systems to determine thickness, roughness and density
- X-ray diffractometry at powders and polycrystalline layers to analyze phases with respect to quantity and quality
- development of new optical systems
Link to Further Details
Points of Contact
Dr. Stefan Braun
Web:
Phone:
+49 351 83391-3432
Fax:
+49 351 83391-3314
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
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X-Ray Diffractometer Bruker D8 ADVANCE (Quelle: www.bruker.com) |
Last Update
Last updated at: 13 July 2017 at 11:54:12