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X-Ray Diffractometer (XRD) / Röntgendiffraktometer Bruker AXS GmbH D8 ADVANCE

Basic Information

Name:	X-Ray Diffractometer (XRD) / Röntgendiffraktometer
Manufacturer:	Bruker AXS GmbH
Model:	D8 ADVANCE
Facility:	X-Ray and EUV Optics
Partner:	Fraunhofer Institute for Material and Beam Technology (IWS)

Description

Technical data

X-ray tube (Cu, Mo, Co, ...) with 0.04 x 12 mm² long-fine focus or 0.4 x 0.4 mm² point focus
sample holder: fixed, Ø = 150 mm
scintillation detector
beam divergence: Δθ < 0.02 °
use of Ni/C - Goebel mirror for:
- monochromization and suppression of fluorescence radiation
- suppression of Cu-Kß radiation
- simple adjustment and short measuring times for parallel beam geometry

Application

X-ray reflectometry at thin layer systems to determine thickness, roughness and density
X-ray diffractometry at powders and polycrystalline layers to analyze phases with respect to quantity and quality
development of new optical systems

Link to Further Details

https://www.bruker.com/products/x-ray-diffraction-and-elemental-analysis/x-ray-diffraction/d8-advance/overview.html

Points of Contact

Dr. Stefan Braun

Web:

http://www.iws.fraunhofer.de/en/business_fields/pvd_nanotechnology/xray_euv_optics.html

Phone:

+49 351 83391-3432

Fax:

+49 351 83391-3314

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Preview	Description
	X-Ray Diffractometer Bruker D8 ADVANCE (Quelle: www.bruker.com)

Last Update

Last updated at: 13 July 2017 at 11:54:12