Atomic Force Microscope (AFM) - Scanning Probe Microscopy (SPM) Park Systems XE-100

Basic Information

Name:	Atomic Force Microscope (AFM) - Scanning Probe Microscopy (SPM)
Manufacturer:	Park Systems
Model:	XE-100
Facility:	Hardmetals and Cermets
Partner:	Fraunhofer Institute for Ceramic Technologies and Systems (IKTS)

Description

Atomic Force Microscope (AFM ) is a scanning probe imaging technique allowing observation with atomic level resolution and study the physical properties such as mechanical, magnetic, electrical and the force measurements in a wide range of materials.

Messbereich:

Scanbereich XY: 100x100 μm
Z: max 25 μm
max. Probengröße: 80x80x20 mm

Link to Further Details

https://youtu.be/UEIn5XlKGrQ

Points of Contact

Dipl.-Ing. Johannes Pötschke

Web:

http://www.ikts.fraunhofer.de/en/departments/materials_process_characterization/sintering_characterization/hard_metals_cer...

Phone:

+49 351 2553-7641

Fax:

+49 351 2554-278

Notes

This is also an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Preview	Description
	AFM/ SPM Park System XE-100 (Quelle: www.ikts.fraunhofer.de)

Last Update

Last updated at: 21 July 2017 at 14:07:50