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Nanotom® X-Ray Computer Tomography System (XCT) GE Phoenix Nanotom® 180 NF

Basic Information

Name: Nanotom® X-Ray Computer Tomography System (XCT)
Manufacturer: GE Phoenix
Model: Nanotom® 180 NF
Facility: Micro Materials Center (MMC)

Description

The nanotom® is the inspection solution for a wide range of 3D CT applications. Once scanned, the fully three dimensional CT information allows many possibilities for analysis. Precise 3D measurements of complex objects or the automatic generation of first article inspection reports within an hour are possible.

Link to Further Details

https://www.gemeasurement.com/inspection-ndt/radiography-and-computed-tomography/phoenix-nanotom-s

Points of Contact

Prof. Dr. Sven Rzepka (Head of Department)
Phone:
+49 371 45001-421
Fax:
+49 371 45001-521

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

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Last Update

Last updated at: 13 July 2017 at 11:54:13