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View the profile: Micro Materials Center (MMC)

Equipment of Micro Materials Center (MMC)

Fraunhofer Institute for Electronic Nano Systems
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Spectroscopic Ellipsometer SENTECH SE 850 (Quelle: www.sentech.com)

Spectroscopic Ellipsometer / Spektralellipsometer

Manufacturer: SENTECH GmbH
Model: SE 850
Facility: Micro Materials Center

 
PREVAC XPS System (Quelle: www.prevac.eu)

X-Ray Photoelectron Spectroscope (XPS) / Photoelektronenspektroskop

Manufacturer: PREVAC / VG Scienta
Model: PREVAC XPS system with VG Scienta EW 3000 analyser
Facility: Micro Materials Center

 
Raman Microscope Renishaw inVia Reflex (Quelle: www.renishaw.com)

Raman Spectroscope

Manufacturer: Renishaw plc.
Model: Reflex
Facility: Micro Materials Center

 
Nano Indenter Agilent Technologies G200 (Quelle: www.agilent.com)

Nano Indenter

Manufacturer: Agilent Technologies
Model: G200
Facility: Micro Materials Center

 
GE Phoenix Nanotom® XCT System (Quelle: www.gemeasurement.com)

Nanotom® X-Ray Computer Tomography System (XCT)

Manufacturer: GE Phoenix
Model: Nanotom® 180 NF
Facility: Micro Materials Center

 
Digital Instruments NanoScope Dimension 3000 AFM (Quelle: www.asmicro.com)

Atomic Force Microscope (AFM) / Atomkraftmikroskop

Manufacturer: Digital Instruments/Veeco Metrology (today Bruker Corp.)
Model: NanoScope Dimension 3000
Facility: Micro Materials Center

 
Zeiss LSM 5 Laser Scanning Mikroskop (Quelle: www.zeiss.de)

Laser Scanning Mikroskop

Manufacturer: Carl Zeiss Microscopy GmbH
Model: LSM 5 Exciter
Facility: Micro Materials Center

 
Zeiss AURIGA 60 SEM/FIB (Quelle: www.zeiss.com)

Cross Beam Scanning Electron Microscope with Focused Ion Beam (SEM/FIB - REM/FIB)

Manufacturer: Carl Zeiss Microscopy GmbH
Model: AURIGA ® 60
Facility: Micro Materials Center

 
FE-SEM Zeiss SUPRA® 60 (Quelle: www.zeiss.com)

Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop)

Manufacturer: Carl Zeiss AG
Model: SUPRA® 60
Facility: Micro Materials Center

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