Analytical FE-SEM Zeiss Gemini 500
Basic Information
Name: | Analytical FE-SEM | |
Manufacturer: | Zeiss | |
Model: | Gemini 500 | |
Facility: | Dresden Center for Nanoanalysis (DCN) | |
Partner: | Technische Universität Dresden (TUD) | |
Location: | Barkhausenbau, Room S81 |
Short Description
Description
The Gemini 500 SEM belongs to the high-end line of Zeiss SEMs. Released in April 2015, it offers superb performance especially at low landing energies. Resolution is specced at 0.6nm at 15kV and 1.2nm at 500V acceleration voltage. The system also offers vapour pressure mode with the use of the high resolution InLens detectors (up to 150Pa) achieving 1.8nm resolution at 3kV and 30pA N2 pressure (up to 500Pa with cascade detector). It is thus especially suited for insulating samples without coatings. The new column design together with the Tandem Decel option allows landing energies down to 5eV, while maintaing optimum imaging parameters. Working distances between 0.1-50mm allow to explore a wide range of sample dimensions. Further detectors include adjustable segmented slide-in backscatter and STEM detectors.
Analytical add-ons installed on the sytem are a large area 150mm2 Oxford EDX detector and a high resolution, high sensitivity 1MP EBSD camera. These systems can be used in addition to the imaging to characterize the sample with respect to composition and crystallography.
Link to Further Details
https://www.zeiss.com/microscopy/int/products/scanning-electron-microscopes/geminisem.html
Options of instrument usage
- This instrument can be used as an stand-alone device and is available for independent use. Please note possible requirements for access.
- This instrument can be used with the support of a supervising assistant.
- This instrument is used within a service or research collaboration.
Points of Contact
Access Requirements
Training and Acceptance of User agreement. SEM Experience on Zeiss machines is a plus.
Images
Last Update
Last updated at: 27 October 2023 at 08:44:03