"The PI 87 is a depth-sensing mechanical test instrument that is designed to be interfaced with a scanning electron microscope (SEM) or FIB/SEM." [www.hysitron.com]

"The PI 87 is a depth-sensing mechanical test instrument that is designed to be interfaced with a scanning electron microscope (SEM) or FIB/SEM.

This system will perform quantitative nanomechanical testing while simultaneously imaging with the SEM. Furthermore, sample positioning with five degrees of freedom (X, Y, Z, rotation, and tilt) gives the user the freedom to align the sample with an ion beam for sample prep/modification or various detectors for advanced analysis." [www.hysitron.com]