View all instruments of this unit CrossBeam Workstation FE SEM/ FIB (REM/ FIB) Carl Zeiss SMT AG CrossBeam NVision 40 ®
Basic Information
| Name: | CrossBeam Workstation FE SEM/ FIB (REM/ FIB) | |
| Manufacturer: | Carl Zeiss SMT AG | |
| Model: | CrossBeam NVision 40 ® | |
| Facility: | Institute for Emerging Electronic Technologies (IET) | |
| Partner: | Leibniz Institute for Solid State and Materials Research (IFW Dresden) |
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| Location: | Room: B1U.23 | |
Description
The Workstation is combining a high resolution scanning electron microscope (GEMINI® electron-beam column) with a high performance focussed ion beam column. We use this machine to prepare highly polished transmission electron microscopy (TEM) lamellas.
Link to Further Details
https://www.ifw-dresden.de/institutes/iin/laboratories/fib-sem/
Points of Contact
Images
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FE SEM/FIB Zeiss CrossBeam NVision 40® (Quelle: www.ifw-dresden.de) |
Last Update
Last updated at: 13 July 2017 at 11:54:15