View all instruments of this unit LV Scanning Electron Microscope (SEM) JEOL GmbH JSM-6610LV
Basic Information
| Name: | LV Scanning Electron Microscope (SEM) | |
| Manufacturer: | JEOL GmbH | |
| Model: | JSM-6610LV | |
| Facility: | Senior Professorship Microsystems Technology (MST) | |
| Partner: | Technische Universität Dresden (TUD) |
|
Short Description
Rasterelektronenmikroskop mit „Low-Vacuum“-Betrieb.
Description
Rasterelektronenmikroskop mit „Low-Vacuum“-Betrieb.
Link to Further Details
https://www.jeol.co.jp/en/products/detail/JSM-6610series.html
Points of Contact
Prof. Dr.-Ing. habil. W.-J. Fischer/ Mrs. K. Kunz (Sec.)
Web:
Email:
Phone:
+49 (0)351 463-36336
Fax:
+49 (0)351 463-37172
Images
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Source: © JEOL GmbH (https://www.jeol.de) |
SEM JEOL JSM-6510LV |
Last Update
Last updated at: 1 February 2019 at 14:38:01