View all instruments of this unit High-resolution scanning electron microscope Carl Zeiss Microscopy Deutschland GmbH Supra 25
Basic Information
| Name: | High-resolution scanning electron microscope | |
| Manufacturer: | Carl Zeiss Microscopy Deutschland GmbH | |
| Model: | Supra 25 | |
| Partner: | Fraunhofer Institute for Machine Tools and Forming Technology (IWU) |
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| Location: | Fraunhofer IWU Dresden | |
Short Description
High-resolution scanning electron microscope with EDX detector for chemical analysis and EBSD detector for orientation measurement
Description
The Supra 25 scanning electron microscope with EDX detector for chemical analysis and with the EBSD detector for orientation measurement can be used for comprehensive material characterisation. The scanning electron microscope provides a very high magnification (1 kV /3.5 nm; 15 kV/1.7 nm) with a high depth of focus.
In EDX analysis, a sample is scanned by a focused electron beam with a selectable (5 kV - 20 kV) acceleration voltage and the resulting interaction products are analysed.
EBSD analysis is an examination method for local characterisation of the crystal structure of materials.
Options of instrument usage
- This instrument can be used with the support of a supervising assistant.
Points of Contact
Last Update
Last updated at: 13 September 2024 at 14:08:52