Alle Geräte dieser Einrichtung anzeigen X-Ray Diffractometer (XRD) / Röntgendiffraktometer Siemens AG (now: Bruker AXS GmbH) D5005
Informationen
| Name: | X-Ray Diffractometer (XRD) / Röntgendiffraktometer | |
| Hersteller: | Siemens AG (now: Bruker AXS GmbH) | |
| Modell: | D5005 | |
| Einrichtung: | EUV- und Röntgenoptik | |
| Partner: | Fraunhofer-Institut für Werkstoff- und Strahltechnik (IWS) |
|
Beschreibung
Technical data
- X-ray tube (Cu, Mo, Co, ...) with 0.04 x 12 mm2 long-fine focus or 0.4 x 0.4 mm2 point focus
- sample holder: fixed, Ø = 150 mm
- scintillation detector
- beam divergence: Δθ < 0.02 °
- use of Ni/C - Goebel mirror for:
- monochromization and suppression of fluorescence radiation
- suppression of Cu-Kß radiation
- simple adjustment and short measuring times for parallel beam geometry
Application
- X-ray reflectometry at thin layer systems to determine thickness, roughness and density
- X-ray diffractometry at powders and polycrystalline layers to analyze phases with respect to quantity and quality
- development of new optical systems
Link zu weiteren Informationen
Ansprechpartner
Dr. Stefan Braun
Web:
Telefon:
+49 351 83391-3432
Fax:
+49 351 83391-3314
Notizen
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Bilder
| Vorschau | Beschreibung |
|---|---|
|
XRD Siemens D5005 (Quelle: www.labx.com) |
Letztes Update
Zuletzt aktualisiert am: 13. Juli 2017 um 11:54:12