X-Ray Photoelectron Spectroscope (XPS) / Photoelektronenspektroskop PREVAC / VG Scienta PREVAC XPS system with VG Scienta EW 3000 analyser
Informationen
| Name: | X-Ray Photoelectron Spectroscope (XPS) / Photoelektronenspektroskop | |
| Hersteller: | PREVAC / VG Scienta | |
| Modell: | PREVAC XPS system with VG Scienta EW 3000 analyser | |
| Einrichtung: | Micro Materials Center (MMC) | |
Beschreibung
-> Instrument is used for chemical surface analysis.
Measure/Resolution:
chemical composition (at %)
Accessory/Options:
- max. 200 mm wafers
- surface analysis
- depth profiling
- angular resolved acquisition
Link zu weiteren Informationen
Ansprechpartner
Prof. Dr. Sven Rzepka (Head of Department)
Web:
Telefon:
+49 371 45001-421
Fax:
+49 371 45001-521
Notizen
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Bilder
Letztes Update
Zuletzt aktualisiert am: 13. Juli 2017 um 11:54:13