Transmission Electron Microscope (TEM) Tecnai™ FEI Company (Thermo Fisher Scientific) Tecnai F30

Informationen

Name:	Transmission Electron Microscope (TEM) Tecnai™
Hersteller:	FEI Company (Thermo Fisher Scientific)
Modell:	Tecnai F30
Einrichtung:	Micro- and Nanostructures
Partner:	Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden (IFW Dresden)

Operates at 300 kV accelerating voltage and is equipped with:

Field emission gun (FEG)
Super-twin alpha objective lens
Scanning unit (STEM) with bright field (BF), dark field (DF), and high angle annular dark field (HAADF) detector
Energy dispersive X-ray spectrometer (EDXS) (Edax EDAMIII with super ultra thin window)
Imaging energy filter (Gatan GIF 200)
Multiscan CCD camera (Gatan MSC 794)
Integrated programmable user interface for all components

Dr. Thomas Gemming/ Mrs. B. Präßler-Wüstling (Sec.)

Web:

E-Mail:

Telefon:

+49 (0) 351 4659-217

Fax:

+49 (0) 351 4659-452

Performance of our Tecnai F30:

Specimens:	Thickness 5 - 300 nm, diameter 3 mm
Holders:	Single tilt low background (+- 40° tilt), double tilt low background, double tilt low background with cooling (liquid N2), double tilt rotation holder, in-situ straining holder, in-situ STM holder
Resolution:	Point res. 0.19 nm, Information limit 0.12 nm
Magnification:	70 x - 18 Mill. x
STEM:	Resolution 0.2 nm (Mag. up to 230 Mill. x) BF-, DF-, HAADF-detectors
EDXS:	Lateral resolution < 2 nm. Detection of all chemical elements with Z >= 5 (Bor), detection limit 0.5 %, correctness 20 %
EELS:	Lateral resolution < 1 nm. Energy resolution < 1 eV. Especially effective for light elements (e.g. B, C, N, O), detection limit very matrix dependent, >= 0.5 %, correctness 30 %
Energy filtered imaging:	Lateral resolution < 1 nm, energy resolution about 1 eV.

Vorschau	Beschreibung
	TEM Tecnai F30 (Quelle: www.ifw-dresden.de)

Zuletzt aktualisiert am: 13. Juli 2017 um 11:54:15