In our department, micro- and nanostructured materials and devices are investigated. This ranges from the basic interaction of Fe with C, the deposition of metals films by various methods up to functional devices and applications based on surface acoustic wave (SAW) technology. Furthermore, modern transmission electron microscopy (TEM) is used to image and characterize nano structured materials on a nanometer scale. The spectroscopic methods we use are Energy Dispersive X-ray Spectroscopy (EDXS) and Electron Energy Loss Spectroscopy (EELS and ELNES). Material classes include thin metallic films, multi layers having special magnetic or electronic properties, molecular nanostructures like graphene or carbon nanotubes, and other interesting materials. Also various in-situ experiments are carried out in the electron microscopes.

Research Topics

Overview available methods

The following methods are available and can be performed in the department:

Further methods:

• Glow Discharge Optical Emission Spectrometry (GD-OES)
• Measurement of Layer Thicknesses (Optical & Mechanical & Analytical)
• Life Time Measurements of Electronic Devices
• Electrical Resistance Measurements
• Surface Analysis
  • XPS
  • AR-XPS
  • AES (Auger Electron Spectrometry)
  • SIMS
• AFM
• Nanomanipulation (in LM, SEM, FIB, TEM)
• Measuring strength of ductile thin films