View all instruments of this unit Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) Hitachi HTA SU8000
Basic Information
| Name: | Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) | |
| Manufacturer: | Hitachi HTA | |
| Model: | SU8000 | |
| Facility: | Materials Analysis | |
| Partner: | Fraunhofer Institute for Electron Beam and Plasma Technology (FEP) |
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Description
Measure/Resolution:
1 nm (15 keV), 1.4 nm (1 keV)
Accessory/Options:
EBIC; EDS (Apollo XV; EDAX)
Link to Further Details
Points of Contact
Dr. Olaf Zywitzki
Web:
Phone:
+49 351 2586-180
Fax:
+49 351 258655-180
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
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Hitachi High-Tech FE SEM SU8000 (Quelle: www.fep.fraunhofer.de) |
Last Update
Last updated at: 13 July 2017 at 11:54:12