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Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) Hitachi HTA SU8000

Basic Information

Name: Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop)
Manufacturer: Hitachi HTA
Model: SU8000
Facility: Materials Analysis
Partner: Fraunhofer Institute for Organic Electronics, Electron Beam and Plasma Technology (FEP)

Description

Measure/Resolution:

1 nm (15 keV), 1.4 nm (1 keV)

Accessory/Options:

EBIC; EDS (Apollo XV; EDAX)

Link to Further Details

http://hitachi-hta.com/products/electron-ion-and-probe-microscopy/field-emission-sem/su8000-series-uhr-cold-emissio

Points of Contact

Dr. Olaf Zywitzki
Phone:
+49 351 2586-180
Fax:
+49 351 258655-180

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Last Update

Last updated at: 13 July 2017 at 11:54:12