View all instruments of this unit Röntgendiffraktometer XRD/XRR Firma Richard Seifert & Co. Ahrensburg (GE Inspection Technologies GmbH) XRD 3000PTS
Basic Information
| Name: | Röntgendiffraktometer XRD/XRR | |
| Manufacturer: | Firma Richard Seifert & Co. Ahrensburg (GE Inspection Technologies GmbH) | |
| Model: | XRD 3000PTS | |
| Facility: | Microelectronic Materials and Nanoanalysis | |
| Partner: | Fraunhofer Institute for Ceramic Technologies and Systems (IKTS) |
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Link to Further Details
http://www.ge-mcs.com/de/radiography-x-ray/analytical-x-ray-xrd/1359-siweb-pl552.html
Points of Contact
Access Requirements
Measure/Resolution:
- lattice parameter, stress, texture map
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
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Röntgendiffraktometer XRD 3000PTS (Quelle: www.mb.uni-siegen.de) |
Last Update
Last updated at: 13 July 2017 at 11:54:12