Field Emission Scanning Electron Microscope (FE-SEM) JEOL GmbH JSM-7800F Prime (SEM) FE REM
Basic Information
Name: | Field Emission Scanning Electron Microscope (FE-SEM) | |
Manufacturer: | JEOL GmbH | |
Model: | JSM-7800F Prime (SEM) FE REM | |
Facility: | Competence Materials Characterization and Testing | |
Partner: | Fraunhofer Institute for Material and Beam Technology (IWS) |
Short Description
Analytical field emission scanning electron microscope with ultra-high resolution
Description
- Equipment/ technical data
- Emission: thermal in-lens field emission cathode
- Acceleration voltage: 10 V to 30 kV
- Resolution: 0,7 nm for acceleration voltage up to 1 KV
- Detectors: in-lens SE and BSE, BSE-detector with high resolution, STEM
- Additional „Gentle-Beam-Super-High (GBSH)“- mode to reduce lens aberration
- Energy-dispersive an wavelength-dispersive X-ray spectroscopy (EDX and WDX) by Oxford Instruments
- Methods
- Imaging and analysis of nanoscaled structure details
- Imaging and analysis of magnetic specimens with low acceleration voltage
- Imaging of thin specimens transparent to electrons in STEM-mode
- Determination of chemical composition including light elements (B,C,N,O)
Options of instrument usage
- This instrument is used within a service or research collaboration.
Points of Contact
Prof. Dr. Martina Zimmermann
Web:
Phone:
+49 351 83391-3573
Associated Services
Images
Last Update
Last updated at: 5 August 2019 at 10:21:21