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High-resolution, imaging and analytical characterization of laser-modified edge zones, joining interfaces, thin-film systems, nanotubes and nanoparticles

Basic Information

Name:	High-resolution, imaging and analytical characterization of laser-modified edge zones, joining interfaces, thin-film systems, nanotubes and nanoparticles
Facility:	Competence Materials Characterization and Testing
Partner:	Fraunhofer Institute for Material and Beam Technology (IWS)

Associated Instruments

Name	Preview	Actions
Laboratory for preparation using electron microscopy
Scanning Electron Microscope (SEM)
Field Emission Scanning Electron Microscope (FE-SEM)
Analytic double-beam-system Focused Ion Beam and scanning electron microscope
Analytic transmission electron microscope 200 kV
Metallography laboratory

Images

Preview	Description
Source: Fraunhofer IWS	Install a sample on the field emission SEM