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Scanning Electron Microscope (SEM) JEOL GmbH JSM-6610LV

Basic Information

Name:	Scanning Electron Microscope (SEM)
Manufacturer:	JEOL GmbH
Model:	JSM-6610LV
Facility:	Competence Materials Characterization and Testing
Partner:	Fraunhofer Institute for Material and Beam Technology (IWS)

Short Description

Analytical scanning electron microscope with "Low-Vacuum"

Description

Equipment/ technical data
- Emission: tungsten cathode
- Acceleration voltage: 1 kV to 30 kV
- Resolution: 3 nm (30 kV), 15 nm (1 kV)
- Detectors: SE, BSE
- “Low-Vacuum”- operation for analysis of low conducting specimens
- Additional equipment: EDX-detector (Oxford Instruments)
- Large specimen chamber suitable for specimen size up to 200 mm
Methods
- Scanning electron micrographs of specimen surfaces
- Analysis of diverse structure specifications of metallic and non-metallic materials
- determination of chemical composition including light elements (B,C,N,O) with high local resolution

Options of instrument usage

This instrument is used within a service or research collaboration.

Points of Contact

Prof. Dr. Martina Zimmermann

Web:

http://www.iws.fraunhofer.de/en/business_fields/materials_characterization/service_offers.html

Phone:

+49 351 83391-3573

Notes

Associated Services

Name	Preview	Actions
Development and evaluation of process- and application-specific testing strategies
Failure and damage analysis
High-resolution, imaging and analytical characterization of laser-modified edge zones, joining interfaces, thin-film systems, nanotubes and nanoparticles
Product accompanying quality assurance
Metallographic, electron microscopic and microanalytical characterization of the real structure of metals, ceramics and composites

Images

Preview	Description
Source: Fraunhofer IWS	Analytical scanning electron microscope - JEOL JSM-6610 LV

Last Update

Last updated at: 5 August 2019 at 10:16:43