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Analytic transmission electron microscope 200 kV JEOL JEM-2100Plus

Basic Information

Name: Analytic transmission electron microscope 200 kV
Manufacturer: JEOL
Model: JEM-2100Plus
Facility: Competence Materials Characterization and Testing
Partner: Fraunhofer Institute for Material and Beam Technology (IWS)

Short Description

Analytic transmission electron microscope 200 kV- JEOL JEM-2100Plus

Description

  • Equipment/ technical data
    • Emission: LaB6-Cathode
    • Acceleration voltage: 200 kV
    • High resolution analytic pole shoe
      • dot resolution = 0,23 nm
      • line resolution = 0,14 nm
      • direct imaging of atomic structures
    • Specimen tilt: ± 30°
    • Four-stage condenser system for flexible beam control
    • Wide-angle camera for fast live image, overview and diffraction-image
    • High resolution camera with an outstanding image-quality
    • Additional equipment: Multi-scan-camera-system and EDX micro-analysis with drift correction (JED2300T)
  • Methods
    • Conventional transmission electron microscopy
    • High resolution transmission electron microscopy (HRTEM)
    • Electron  diffraction: Selected Area Diffraction (SAD), Nano Beam Diffraction
    • Scanning transmission electron microscopy (STEM):  angle annular dark-field imaging (HAADF)
    • Local element analysis with EDX (≥ 10nm), Spot analysis, Line scan, Mapping, Sequential analysis
    • Analysis of the materials inner structure: lattice defects, grain boundaries, segregations 
    • Equipment/ technical data
      • Emission: LaB6-Cathode
      • Acceleration voltage: 200 kV
      • High resolution analytic pole shoe
        • dot resolution = 0,23 nm
        • line resolution = 0,14 nm
        • direct imaging of atomic structures
      • Specimen tilt: ± 30°
      • Four-stage condenser system for flexible beam control
      • Wide-angle camera for fast live image, overview and diffraction-image
      • High resolution camera with an outstanding image-quality
      • Additional equipment: Multi-scan-camera-system and EDX micro-analysis with drift correction (JED2300T)
    • Methods
      • Conventional transmission electron microscopy
      • High resolution transmission electron microscopy (HRTEM)
      • Electron  diffraction: Selected Area Diffraction (SAD), Nano Beam Diffraction
      • Scanning transmission electron microscopy (STEM):  angle annular dark-field imaging (HAADF)
      • Local element analysis with EDX (≥ 10nm), Spot analysis, Line scan, Mapping, Sequential analysis
      • Analysis of the materials inner structure: lattice defects, grain boundaries, segregations 

Options of instrument usage

Points of Contact

Associated Services

Name Preview Actions
Failure and damage analysis
High-resolution, imaging and analytical characterization of laser-modified edge zones, joining interfaces, thin-film systems, nanotubes and nanoparticles
Development and evaluation of process- and application-specific testing strategies
Product accompanying quality assurance
Metallographic, electron microscopic and microanalytical characterization of the real structure of metals, ceramics and composites

Images

Last Update

Last updated at: 5 August 2019 at 10:26:56