Analytic transmission electron microscope 200 kV JEOL JEM-2100Plus

Basic Information

Name:	Analytic transmission electron microscope 200 kV
Manufacturer:	JEOL
Model:	JEM-2100Plus
Facility:	Competence Materials Characterization and Testing
Partner:	Fraunhofer Institute for Material and Beam Technology (IWS)

Short Description

Analytic transmission electron microscope 200 kV- JEOL JEM-2100Plus

Description

Equipment/ technical data
- Emission: LaB₆-Cathode
- Acceleration voltage: 200 kV
- High resolution analytic pole shoe
  - dot resolution = 0,23 nm
  - line resolution = 0,14 nm
  - direct imaging of atomic structures
- Specimen tilt: ± 30°
- Four-stage condenser system for flexible beam control
- Wide-angle camera for fast live image, overview and diffraction-image
- High resolution camera with an outstanding image-quality
- Additional equipment: Multi-scan-camera-system and EDX micro-analysis with drift correction (JED2300T)
Methods
- Conventional transmission electron microscopy
- High resolution transmission electron microscopy (HRTEM)
- Electron diffraction: Selected Area Diffraction (SAD), Nano Beam Diffraction
- Scanning transmission electron microscopy (STEM): angle annular dark-field imaging (HAADF)
- Local element analysis with EDX (≥ 10nm), Spot analysis, Line scan, Mapping, Sequential analysis
- Analysis of the materials inner structure: lattice defects, grain boundaries, segregations
- Equipment/ technical data
  - Emission: LaB₆-Cathode
  - Acceleration voltage: 200 kV
  - High resolution analytic pole shoe
    - dot resolution = 0,23 nm
    - line resolution = 0,14 nm
    - direct imaging of atomic structures
  - Specimen tilt: ± 30°
  - Four-stage condenser system for flexible beam control
  - Wide-angle camera for fast live image, overview and diffraction-image
  - High resolution camera with an outstanding image-quality
  - Additional equipment: Multi-scan-camera-system and EDX micro-analysis with drift correction (JED2300T)
- Methods
  - Conventional transmission electron microscopy
  - High resolution transmission electron microscopy (HRTEM)
  - Electron diffraction: Selected Area Diffraction (SAD), Nano Beam Diffraction
  - Scanning transmission electron microscopy (STEM): angle annular dark-field imaging (HAADF)
  - Local element analysis with EDX (≥ 10nm), Spot analysis, Line scan, Mapping, Sequential analysis
  - Analysis of the materials inner structure: lattice defects, grain boundaries, segregations

Options of instrument usage

This instrument is used within a service or research collaboration.

Points of Contact

Prof. Dr. Martina Zimmermann

Web:

http://www.iws.fraunhofer.de/en/business_fields/materials_characterization/service_offers.html

Phone:

+49 351 83391-3573

Associated Services

Name	Preview	Actions
Failure and damage analysis
Development and evaluation of process- and application-specific testing strategies
Product accompanying quality assurance
High-resolution, imaging and analytical characterization of laser-modified edge zones, joining interfaces, thin-film systems, nanotubes and nanoparticles
Metallographic, electron microscopic and microanalytical characterization of the real structure of metals, ceramics and composites

Images

Preview	Description
Source: Fraunhofer IWS	Analytic transmission electron microscope 200 kV- JEOL JEM-2100Plus

Last Update

Last updated at: 5 August 2019 at 10:26:56