FE SEM/ FIB (REM/ FIB) Carl Zeiss SMT AG CrossBeam NVision 40 ®

Basic Information

Name:	FE SEM/ FIB (REM/ FIB)
Manufacturer:	Carl Zeiss SMT AG
Model:	CrossBeam NVision 40 ®
Facility:	Ceramography and Phase Analysis
Partner:	Fraunhofer Institute for Ceramic Technologies and Systems (IKTS)

Description

The NVision 40 CrossBeam ® is a field emission scanning electron microscope (FESEM) combined with a focused ion beam (FIB). It is a high performance instrument designed for microstructural sectioning, imaging and analytical applications.

Accessory/Options:

EDS
EBSD
Transfermodul

Points of Contact

Dr. Sören Höhn / Dipl.-Phys. Jochen Mürbe

Web:

http://www.ikts.fraunhofer.de/en/departments/materials_process_characterization/sintering_characterization/ceramography_ph...

Phone:

+49 351 2553-7527

Fax:

+49 351 2554-122

Notes

This is also an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Preview	Description
	FE SEM/FIB Zeiss CrossBeam NVision 40® (Quelle: www.ikts.fraunhofer.de)

Last Update

Last updated at: 13 July 2017 at 11:54:13