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View all instruments of this unit FE SEM/ FIB (REM/ FIB) Carl Zeiss SMT AG CrossBeam NVision 40 ®
Basic Information
| Name: | FE SEM/ FIB (REM/ FIB) | |
| Manufacturer: | Carl Zeiss SMT AG | |
| Model: | CrossBeam NVision 40 ® | |
| Facility: | Ceramography and Phase Analysis | |
| Partner: | Fraunhofer Institute for Ceramic Technologies and Systems (IKTS) |
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Description
The NVision 40 CrossBeam ® is a field emission scanning electron microscope (FESEM) combined with a focused ion beam (FIB). It is a high performance instrument designed for microstructural sectioning, imaging and analytical applications.
Accessory/Options:
- EDS
- EBSD
- Transfermodul
Points of Contact
Dr. Sören Höhn / Dipl.-Phys. Jochen Mürbe
Web:
Phone:
+49 351 2553-7527
Fax:
+49 351 2554-122
Notes
This is also an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
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FE SEM/FIB Zeiss CrossBeam NVision 40® (Quelle: www.ikts.fraunhofer.de) |
Last Update
Last updated at: 13 July 2017 at 11:54:13