FE SEM/ FIB (REM/ FIB) Carl Zeiss SMT AG CrossBeam NVision 40 ®

Informationen

Name:	FE SEM/ FIB (REM/ FIB)
Hersteller:	Carl Zeiss SMT AG
Modell:	CrossBeam NVision 40 ®
Einrichtung:	Keramografie und Phasenanalyse
Partner:	Fraunhofer-Institut für Keramische Technologien und Systeme (IKTS)

Beschreibung

The NVision 40 CrossBeam ® is a field emission scanning electron microscope (FESEM) combined with a focused ion beam (FIB). It is a high performance instrument designed for microstructural sectioning, imaging and analytical applications.

Accessory/Options:

EDS
EBSD
Transfermodul

Ansprechpartner

Dr. Sören Höhn / Dipl.-Phys. Jochen Mürbe

Web:

http://www.ikts.fraunhofer.de/en/departments/materials_process_characterization/sintering_characterization/ceramography_ph...

Telefon:

+49 351 2553-7527

Fax:

+49 351 2554-122

Notizen

This is also an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Bilder

Vorschau	Beschreibung
	FE SEM/FIB Zeiss CrossBeam NVision 40® (Quelle: www.ikts.fraunhofer.de)

Letztes Update

Zuletzt aktualisiert am: 13. Juli 2017 um 11:54:13