10 results
Rasterelektronenmikroskop (REM) / Scanning Electron Microscope (SEM)
Manufacturer: Leica Microsystems GmbH Model: S260 Facility: Ceramography and Phase Analysis
Ion-Beam Sample Preparation for Electron Microscopy / Ionenstrahlpräparationsgerät
Manufacturer: Leica Microsystems GmbH Model: EM RES 101 Facility: Ceramography and Phase Analysis
Atomic Force Microscope (AFM) / Rasterkraftmikroskop (RKM)
Manufacturer: TopoMetrix Model: Explorer Facility: Ceramography and Phase Analysis
Field Emission Scanning Electron Microscope (FESEM) /
Manufacturer: Carl Zeiss Microscopy GmbH Model: Gemini 982 Facility: Ceramography and Phase Analysis
Röntgenfluoreszenzspektrometer (RFA / XRF)
Manufacturer: Bruker Corporation Model: S8 TIGER Facility: Ceramography and Phase Analysis
FE SEM/ FIB (REM/ FIB)
Manufacturer: Carl Zeiss SMT AG Model: CrossBeam NVision 40 ® Facility: Ceramography and Phase Analysis
X-Ray Diffractometer (XRD) / Röntgendiffraktometer
Manufacturer: Bruker Corporation Model: D8 Facility: Ceramography and Phase Analysis
Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop)
Manufacturer: Carl Zeiss AG Model: Ultra 55 PLUS Facility: Ceramography and Phase Analysis
X-Ray Diffraction System (XRD) / Röntgendiffraktometer mit Hochtemperaturkammer
Manufacturer: GE Inspection Technologies Model: 3003 TT Facility: Ceramography and Phase Analysis