Dresden
Technology Portal

 
Your access to research infrastructure and know-how
 
de|en
View the profile: Ceramography and Phase Analysis

Equipment of Ceramography and Phase Analysis

Fraunhofer Institute for Ceramic Technologies and Systems
Filter:

institutions: this unit(10), daughter units(0),

Results per page:
Sort:

10 results

 
Leica SEM S260

Rasterelektronenmikroskop (REM) / Scanning Electron Microscope (SEM)

Manufacturer: Leica Microsystems GmbH
Model: S260
Facility: Ceramography and Phase Analysis

 
Leica EM RES 101(Quelle: www.leica-microsystems.com)

Ion-Beam Sample Preparation for Electron Microscopy / Ionenstrahlpräparationsgerät

Manufacturer: Leica Microsystems GmbH
Model: EM RES 101
Facility: Ceramography and Phase Analysis

 
TopoMetrix AFM Explorer

Atomic Force Microscope (AFM) / Rasterkraftmikroskop (RKM)

Manufacturer: TopoMetrix
Model: Explorer
Facility: Ceramography and Phase Analysis

 
Carl Zeiss DSM Gemini 982 FESEM

Field Emission Scanning Electron Microscope (FESEM) /

Manufacturer: Carl Zeiss Microscopy GmbH
Model: Gemini 982
Facility: Ceramography and Phase Analysis

 
Bruker S8 TIGER Röntgenfluoreszenzspektrometer (Quelle: www.bruker.com)

Röntgenfluoreszenzspektrometer (RFA / XRF)

Manufacturer: Bruker Corporation
Model: S8 TIGER
Facility: Ceramography and Phase Analysis

 

Energiedispersive Röntgenspektroskopie (EDX) mit ISIS, Si(Li)-Detektor

Facility: Ceramography and Phase Analysis

 
FE SEM/FIB Zeiss CrossBeam NVision 40® (Quelle: www.ikts.fraunhofer.de)

FE SEM/ FIB (REM/ FIB)

Manufacturer: Carl Zeiss SMT AG
Model: CrossBeam NVision 40 ®
Facility: Ceramography and Phase Analysis

 
Bruker XRD D8 DISCOVER (Quelle: www.bruker.com)

X-Ray Diffractometer (XRD) / Röntgendiffraktometer

Manufacturer: Bruker Corporation
Model: D8
Facility: Ceramography and Phase Analysis

 
FESEM Zeiss Ultra 55 PLUS (Quelle: www.ikts.fraunhofer.de)

Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop)

Manufacturer: Carl Zeiss AG
Model: Ultra 55 PLUS
Facility: Ceramography and Phase Analysis

 
GE Diffractometer System XRD 3003 TT (Quelle: www.ge-mcs.com)

X-Ray Diffraction System (XRD) / Röntgendiffraktometer mit Hochtemperaturkammer

Manufacturer: GE Inspection Technologies
Model: 3003 TT
Facility: Ceramography and Phase Analysis

1