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X-Ray Diffraction System (XRD) / Röntgendiffraktometer mit Hochtemperaturkammer GE Inspection Technologies 3003 TT

Basic Information

Name: X-Ray Diffraction System (XRD) / Röntgendiffraktometer mit Hochtemperaturkammer
Manufacturer: GE Inspection Technologies
Model: 3003 TT
Facility: Ceramography and Phase Analysis
Partner: Fraunhofer Institute for Ceramic Technologies and Systems (IKTS)

Description

Messgröße:

  • Dünnschichtmessung -> Phasengehalt im Bereich der Dünnschicht

Messbereich:

Dünnschichten von wenigen nm bis einige μm

Link to Further Details

http://www.ge-mcs.com

Points of Contact

Dr. Sören Höhn / Dipl.-Phys. Jochen Mürbe
Phone:
+49 351 2553-7527
Fax:
+49 351 2554-122

Notes

This is also an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Last Update

Last updated at: 13 July 2017 at 11:54:13