View all instruments of this unit Atomic Force Microscope (AFM) / Atomkraftmikroskop Digital Instruments/Veeco Metrology (today Bruker Corp.) NanoScope Dimension 3000
Basic Information
| Name: | Atomic Force Microscope (AFM) / Atomkraftmikroskop | |
| Manufacturer: | Digital Instruments/Veeco Metrology (today Bruker Corp.) | |
| Model: | NanoScope Dimension 3000 | |
| Facility: | Micro Materials Center (MMC) | |
Points of Contact
Prof. Dr. Sven Rzepka (Head of Department)
Web:
Phone:
+49 371 45001-421
Fax:
+49 371 45001-521
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
| Preview | Description |
|---|---|
|
Digital Instruments NanoScope Dimension 3000 AFM (Quelle: www.asmicro.com) |
Last Update
Last updated at: 13 July 2017 at 11:54:13