View all instruments of this unit Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) Carl Zeiss AG SUPRA® 60
Basic Information
| Name: | Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) | |
| Manufacturer: | Carl Zeiss AG | |
| Model: | SUPRA® 60 | |
| Facility: | Micro Materials Center (MMC) | |
Description
Measure/Resolution:
SEM: 1 nm
Accessory/Options:
- max. 200 mm wafers
- BRUKER EDX
Link to Further Details
http://www.zeiss.com/microscopy/en_de/products/scanning-electron-microscopes/supra-materials.html
Points of Contact
Prof. Dr. Sven Rzepka (Head of Department)
Web:
Phone:
+49 371 45001-421
Fax:
+49 371 45001-521
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
| Preview | Description |
|---|---|
|
FE-SEM Zeiss SUPRA® 60 (Quelle: www.zeiss.com) |
Last Update
Last updated at: 13 July 2017 at 11:54:13