View all instruments of this unit Rasterelektronenmikroskop (REM) / Scanning Electron Microscope (SEM) Leica Microsystems GmbH S260
Basic Information
| Name: | Rasterelektronenmikroskop (REM) / Scanning Electron Microscope (SEM) | |
| Manufacturer: | Leica Microsystems GmbH | |
| Model: | S260 | |
| Facility: | Ceramography and Phase Analysis | |
| Partner: | Fraunhofer Institute for Ceramic Technologies and Systems (IKTS) |
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Description
Messgrößen:
- Bruchanalyse
- Oberfläche
Messbereich:
von 1mm bis 100nm
Points of Contact
Dr. Sören Höhn / Dipl.-Phys. Jochen Mürbe
Web:
Phone:
+49 351 2553-7527
Fax:
+49 351 2554-122
Images
| Preview | Description |
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Leica SEM S260 |
Last Update
Last updated at: 13 July 2017 at 11:54:15