Dresden
Technology Portal

 
Your access to research infrastructure and know-how
 
de|en
View all instruments of this unit

Ion-Beam Sample Preparation for Electron Microscopy / Ionenstrahlpräparationsgerät Leica Microsystems GmbH EM RES 101

Basic Information

Name: Ion-Beam Sample Preparation for Electron Microscopy / Ionenstrahlpräparationsgerät
Manufacturer: Leica Microsystems GmbH
Model: EM RES 101
Facility: Ceramography and Phase Analysis
Partner: Fraunhofer Institute for Ceramic Technologies and Systems (IKTS)

Description

Ion beam preparation for thinning, cleaning and in-situ coating in one single system.

 

Messbereich:

  • Größe 10x10x10mm
  • Größe 4x3x1 mm

Link to Further Details

http://www.leica-microsystems.com/products/sample-preparation-for-electron-microscopy/industrial-materials/solid-state-technology/details/product/leica-em-res101/

Points of Contact

Dr. Sören Höhn / Dipl.-Phys. Jochen Mürbe
Web:
http://www.ikts.fraunhofer.de/en/departments/materials_process_characterization/sintering_characterization/ceramography_ph...
Phone:
+49 351 2553-7527
Fax:
+49 351 2554-122

Images

Last Update

Last updated at: 13 July 2017 at 11:54:15