View all instruments of this unit Transmission Electron Microscope (TEM) Philips CM20 FEG
Basic Information
| Name: | Transmission Electron Microscope (TEM) | |
| Manufacturer: | Philips | |
| Model: | CM20 FEG | |
| Facility: | Micro- and Nanostructures | |
| Partner: | Leibniz Institute for Solid State and Materials Research (IFW Dresden) |
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Description
Our TEM CM 20 FEG operates at 200 kV accelerating voltage and is equipped with:
- Field emission gun (FEG)
- Twin objective lens
- Scanning unit (STEM) with bright field and dark field detector
- Energy dispersive X-ray spectrometer (EDXS) (Noran Voyager IIa)
- Electron energy-loss spectrometer (Gatan PEELS 666)
- TV-rate camera (TVIPS FastScan F114NX)
- Secondary electron detector
- Various specimen holders e.g. for heating, cooling, straining
Link to Further Details
Points of Contact
Dr. Thomas Gemming/ Mrs. B. Präßler-Wüstling (Sec.)
Web:
Email:
Phone:
+49 (0) 351 4659-217
Fax:
+49 (0) 351 4659-452
Images
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TEM CM 20 FEG (Quelle: www.ifw-dresden.de) |
Last Update
Last updated at: 13 July 2017 at 11:54:15