Transmission Electron Microscope (TEM) Philips CM20 FEG
Informationen
Name: | Transmission Electron Microscope (TEM) | |
Hersteller: | Philips | |
Modell: | CM20 FEG | |
Einrichtung: | Micro- and Nanostructures | |
Partner: | Leibniz-Institut für Festkörper- und Werkstoffforschung Dresden (IFW Dresden) |
Beschreibung
Our TEM CM 20 FEG operates at 200 kV accelerating voltage and is equipped with:
- Field emission gun (FEG)
- Twin objective lens
- Scanning unit (STEM) with bright field and dark field detector
- Energy dispersive X-ray spectrometer (EDXS) (Noran Voyager IIa)
- Electron energy-loss spectrometer (Gatan PEELS 666)
- TV-rate camera (TVIPS FastScan F114NX)
- Secondary electron detector
- Various specimen holders e.g. for heating, cooling, straining
Link zu weiteren Informationen
Ansprechpartner
Dr. Thomas Gemming/ Mrs. B. Präßler-Wüstling (Sec.)
Web:
E-Mail:
Telefon:
+49 (0) 351 4659-217
Fax:
+49 (0) 351 4659-452
Bilder
Letztes Update
Zuletzt aktualisiert am: 13. Juli 2017 um 11:54:15