View all instruments of this unit Scanning Electron Microscope Carl Zeiss AG
Basic Information
| Name: | Scanning Electron Microscope | |
| Manufacturer: | Carl Zeiss AG | |
| Partner: | Fraunhofer Institute for Manufacturing Technology and Advanced Materials, Dresden Branch (IFAM) |
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| Location: | Fraunhofer IFAM Dresden | |
Description
Obtainingimagesat large magnification and chemical analysis
Options of instrument usage
- This instrument is used within a service or research collaboration.
Points of Contact
Dr.-Ing. Thomas Weißgärber (prov. director)
Web:
Email:
Phone:
+49 351 2537-300
Fax:
+49 351 2537-399
Notes
ElectronSource: Tungsten cathode
Accelerating Voltage: 200 -30 000 V
Resolution: max. 3 nm at 30 kV
Vacuum: 10-7 - 10-6 mbar
Detectors: SE, BSE
EDX-Detector: 10 mm² Si(Li)
Analysed Elements: starting from Be
Analysing Options: point, line, area
Max. Sample Mass: 2 kg
Sample Count: max. 9
Images
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Scanning Electron Microscope (Carl Zeiss AG) |
Last Update
Last updated at: 3 January 2018 at 13:23:05