Analytic double-beam-system Focused Ion Beam and scanning electron microscope JEOL JIB-4610F
Basic Information
Name: | Analytic double-beam-system Focused Ion Beam and scanning electron microscope | |
Manufacturer: | JEOL | |
Model: | JIB-4610F | |
Facility: | Competence Materials Characterization and Testing | |
Partner: | Fraunhofer Institute for Material and Beam Technology (IWS) |
Short Description
Analytic double-beam-system Focused Ion Beam and scanning electron microscope - JEOL JIB-4610F
Description
- Equipment/ technical data
- Emission: thermal in-lens field emission source (max. 200 nA at 0,1 to 30 kV)
- Ion source: Ga liquid metal (3 pA to max. 90 nA at 30 kV)
- Resolution: 1.2 nm (at 30kV, REM), 4 nm (at 30 kV, SIM)
- Detectors: SE, BSE and STEM for “Live”-preparation of translucent TEM-specimens
- Micromanipulator for TEM-specimen extraction (Kleindiek)
- Additional equipment: EDX- and BDSM-systems
- Methods
- Effective, low-damage high-precision target-preparation of different materials (i.a. metal, synthetic material, composite, layer, nanomaterials)
- „Microfabrication“ / „Nanofabrication“:
- Production of diverse geometric structures
- Typical volumes: 10 μm3
- Typical precision: 10 nm
- 3D-analysis of materials, thermography and 3D-reconstructions; in each case possible to combine with EDX- and BDSM-analysis
- Effective treatment of large surfaces and volumes with ion-ablation with an ion-current up to 90nA
Options of instrument usage
- This instrument is used within a service or research collaboration.
Points of Contact
Prof. Dr. Martina Zimmermann
Web:
Phone:
+49 351 83391-3573
Associated Services
Images
Last Update
Last updated at: 5 August 2019 at 10:31:22