Near-infrared detector sorting system

Manufacturer: Tomra Systems GmbH / Titech
Model: Autosort H-600
Facility: Institut für Abfall- und Kreislaufwirtschaft

Calorimeter

Manufacturer: IKA®-Werke GmbH & Co. KG
Model: Calorimeter C7000
Facility: Institut für Abfall- und Kreislaufwirtschaft

In addition to the possible digestion of samples for subsequent analysis by using ion chromatography the calorimeter is also used to determine sample-specific energy contents.

Gas Chromatograph (GC)

Manufacturer: Agilent Technology Dtl. GmbH / Hewlett Packard / Perkin Elmer
Model: GC/MS HP6890 + MSD5973 + ECD/FID / headspace PE HS40
Facility: Institut für Abfall- und Kreislaufwirtschaft

By using gas chromatography at the institute the chromatograph can be coupled with a mass spectrometry for the analysis of polycyclic aromatic hydrocarbons and phenols.

Inductively Coupled Plasma Spectrometer - Optical Emission Spectroscopy (ICP-OES)

Manufacturer: Perkin Elmer LAS GmbH
Model: ICP-OES "Optima 8000"
Facility: Institut für Abfall- und Kreislaufwirtschaft

Optical emission spectrometry with inductively coupled plasma (ICP-OES), wavelength spectrum: 165-190 nm with resolution of < 0.009 nm @ 200 nm.

Reflected-Light Microscope Zeiss Axio Imager M2m

Manufacturer: Zeiss
Model: Axio Imager M2m
Facility: Dresden Center for Nanoanalysis

Reflected Light microscope with up to 150x objective and Brightfield/Darkfield/Polarization/C-DIC imaging modes

Analytical FE-SEM

Manufacturer: Zeiss
Model: Gemini 500
Facility: Dresden Center for Nanoanalysis

"GeminiSEM 500 brings you more signal and more detail, especially at very low voltages. Its variable pressure mode makes you feel like you’re working in high vacuum." [www.zeiss.com]

Scanning Electron Microscope (FIB/ SEM)

Manufacturer: FEI (now Thermo Fisher)
Model: Helios Nanolab 660
Facility: Dresden Center for Nanoanalysis

The FEI Helios 660 is a state-of-the-art FIB/SEM tool with an electron image resolution of 0.9nm between 1kV and 30kV and a resolution of 1.5nm between 350V and 1kV with numerous in-situ addons.

Sub-Micron X-ray tomograph (XRM, XCT)

Manufacturer: Zeiss/ Xradia
Model: Versa 520
Facility: Dresden Center for Nanoanalysis

The Versa 520 is a state-of-the-art sub-micron X-ray tomograph with an ultimate spatial resolution of 700nm. It non-destructively creates full 3D images of samples and their interiors.

Atom Adsorption Spectrometer

Manufacturer: Agilent Technologies Dtl. GmbH
Model: AAS 220 (Z + FS)
Facility: Chair of Urban Water Management

Drum sieve

Manufacturer: Max Boll GmbH & CO. KG
Model: "Siebmeister"
Facility: Institut für Abfall- und Kreislaufwirtschaft

By using a drum sieve larger amounts of solid samples can be classified in various grain sizes.