View all instruments of this unit Field Emission Scanning Electron Microscope (FE-SEM) Carl Zeiss Microscopy GmbH Gemini SEM 300 (inkl. EDX)
Basic Information
| Name: | Field Emission Scanning Electron Microscope (FE-SEM) | |
| Manufacturer: | Carl Zeiss Microscopy GmbH | |
| Model: | Gemini SEM 300 (inkl. EDX) | |
| Facility: | Chair of Physical Chemistry (PC2) |
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| Partner: | Technische Universität Dresden (TUD) |
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Short Description
This scanning electron microscope (FESEM) enables high resolution imaging of surfaces of all kind of materials.
Description
"The GeminiSEM family stands for effortless imaging with sub-nanometer resolution and high detection efficiency. Rely on surface sensitive imaging and analytics and profit from the highest sample flexibility." [www.zeiss.com]
Link to Further Details
https://www.zeiss.de/mikroskopie/produkte/rasterelektronenmikroskope/geminisem.html
Options of instrument usage
- This instrument is used within a service or research collaboration.
Points of Contact
Dipl.-Ing. (FH) Goldberg, Susanne
Email:
Phone:
463-35164
Prof. Dr. rer. nat. habil. A.Eychmüller/ Mrs. I.Kube (Sec.)
Email:
Phone:
+49 351 463-37597
Fax:
+49 351 463-37164
Images
| Preview | Description |
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Source: ©Susanne Goldberg |
Carl Zeiss Gemini SEM 300 |
Last Update
Last updated at: 6 December 2022 at 16:25:28