View all instruments of this unit Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) JEOL GmbH JSM-6700F
Basic Information
| Name: | Field Emission Scanning Electron Microscope (FE SEM / FE REM Rasterelektronenmikroskop) | |
| Manufacturer: | JEOL GmbH | |
| Model: | JSM-6700F | |
| Facility: | MEMS Technologies Dresden | |
| Partner: | Fraunhofer Institute for Photonic Microsystems (IPMS) |
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Link to Further Details
Points of Contact
Mr. Michael Müller
Web:
Phone:
+49 351 8823-130
Fax:
+49 351 8823-393
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
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FE SEM Jeol JSM-6700F |
Last Update
Last updated at: 13 July 2017 at 11:54:12