Field Emission Scanning Electron Microscope (FE SEM) with focused ion beam (REM/ FIB) Carl Zeiss SMT AG CrossBeam NVision 40 ®
Basic Information
Name: | Field Emission Scanning Electron Microscope (FE SEM) with focused ion beam (REM/ FIB) | |
Manufacturer: | Carl Zeiss SMT AG | |
Model: | CrossBeam NVision 40 ® | |
Facility: | Microelectronic Materials and Nanoanalysis | |
Partner: | Fraunhofer Institute for Ceramic Technologies and Systems (IKTS) |
Description
The NVision 40 CrossBeam ® is a field emission scanning electron microscope (FESEM) combined with a focused ion beam (FIB). It is a high performance instrument designed for microstructural sectioning, imaging and analytical applications.
Available in-situ tools:
- Heating stage
- Rotational 4-point bending tool
- cryo stage
Points of Contact
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
Last Update
Last updated at: 27 February 2023 at 10:57:51