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Field Emission Scanning Electron Microscope (FE SEM) with focused ion beam (REM/ FIB) Carl Zeiss SMT AG CrossBeam NVision 40 ®

Basic Information

Name: Field Emission Scanning Electron Microscope (FE SEM) with focused ion beam (REM/ FIB)
Manufacturer: Carl Zeiss SMT AG
Model: CrossBeam NVision 40 ®
Facility: Microelectronic Materials and Nanoanalysis
Partner: Fraunhofer Institute for Ceramic Technologies and Systems (IKTS)

Description

The NVision 40 CrossBeam ® is a field emission scanning electron microscope (FESEM) combined with a focused ion beam (FIB). It is a high performance instrument designed for microstructural sectioning, imaging and  analytical applications.

Available in-situ tools:

- Heating stage

- Rotational 4-point bending tool

- cryo stage

Points of Contact

Dr. Birgit Jost and Dr. André Clausner
Email:
Phone:
+49 351 88815-547
Fax:
+49 351 88815-509

Notes

This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).

Images

Last Update

Last updated at: 27 February 2023 at 10:57:51