View all instruments of this unit Wafer Testing And Metrology - Wafer Surface Profiler Veeco Instruments Inc. Dektak V 300-Si
Basic Information
| Name: | Wafer Testing And Metrology - Wafer Surface Profiler | |
| Manufacturer: | Veeco Instruments Inc. | |
| Model: | Dektak V 300-Si | |
| Partner: | Fraunhofer Institute for Reliability and Microintegration - All Silicon System Integration Dresden (IZM (ASSID)) |
|
Link to Further Details
Points of Contact
Notes
This is an instrument within the Dresden Fraunhofer Cluster Nanoanalysis (DFCNA).
Images
| Preview | Description |
|---|---|
|
Wafer Surface Profiler Veeco Dektak V 300-Si (Quelle: www.caeonline.com) |
Last Update
Last updated at: 13 July 2017 at 11:54:13