15 results
X–Ray Inspection System
Manufacturer: Nordson DAGE
Model: Nanofocus 3D MicroScan
Facility: Fraunhofer Institute for Reliability and Microintegration - All Silicon System Integration Dresden
X - Ray Fluorescence (XRF) Spectrometer - Wafer Analyzer
Manufacturer: Phillips (now: PANalytical B.V.)
Model: PW2830
Facility: Fraunhofer Institute for Reliability and Microintegration - All Silicon System Integration Dresden
Measurement System / Oberflächenwiderstandsmesser
Manufacturer: veonis Technologies GmbH/ CDE
Model: CDE ResMap
Facility: Fraunhofer Institute for Reliability and Microintegration - All Silicon System Integration Dresden
Schichtdickenmesssystem
Manufacturer: Nova / Fries Research & Technology GmbH (FRT)
Facility: Fraunhofer Institute for Reliability and Microintegration - All Silicon System Integration Dresden
X-Ray Inspection System
Manufacturer: Nordson DAGE
Model: XD7600NT Diamond FP
Facility: Fraunhofer Institute for Reliability and Microintegration - All Silicon System Integration Dresden