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View the profile: PVD and Nanotechnology

Equipment of PVD and Nanotechnology

Fraunhofer Institute for Material and Beam Technology
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FLX-2320 Toho Technology (Quelle: www.iws.fraunhofer.de)

Thin Film Stress Measurement System / Eigenspannungsmessgerät dünner Schichten

Manufacturer: Toho Technology Inc.
Model: FLX-2320
Facility: X-Ray and EUV Optics

 
X-Ray Diffractometer Bruker D8 ADVANCE (Quelle: www.bruker.com)

X-Ray Diffractometer (XRD) / Röntgendiffraktometer

Manufacturer: Bruker AXS GmbH
Model: D8 ADVANCE
Facility: X-Ray and EUV Optics

 
XRD Siemens D5005 (Quelle: www.labx.com)

X-Ray Diffractometer (XRD) / Röntgendiffraktometer

Manufacturer: Siemens AG (now: Bruker AXS GmbH)
Model: D5005
Facility: X-Ray and EUV Optics

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