View the profile: Central Units Equipment of Central Units
343 results
Ultra-High-Resolution analytical DualBeam FIB/SEM system
Manufacturer: FEI (now: Thermo Fisher Scientific) Model: Scios LoVac Dual Beam Facility: Multi-Scale Analysis (Zlotnikov Group)
"FEI Scios™ is an ultra-high-resolution analytical DualBeam™ system that delivers outstanding 2D and 3D performance for a broad range of samples, including magnetic material." [www.fei.com]
Nanoindentation Platform / Nanoindenter
Manufacturer: Bruker Corp. Model: Hysitron TI 950 TriboIndenter Facility: Multi-Scale Analysis (Zlotnikov Group)
"Hysitron TI 950 TriboIndenter nanoindenter has been developed as an automated, high throughput instrument to support the numerous nanomechanical and nanotribological characterization techniques..."
PicoIndenter
Manufacturer: Hysitron Inc. (heute: Bruker) Model: PI 87 Facility: Dresden Center for Nanoanalysis
"The PI 87 is a depth-sensing mechanical test instrument that is designed to be interfaced with a scanning electron microscope (SEM) or FIB/SEM." [www.hysitron.com]
Scale
Manufacturer: Sartorius Model: Laboratory MC 1 6200 D Facility: Laboratorium für Bodenmechanik
