Atomic Force Microscope Nanosurf CoreAFM
Basic Information
Name: | Atomic Force Microscope | |
Manufacturer: | Nanosurf | |
Model: | CoreAFM | |
Facility: | Chair of Laser-based Manufacturing | |
Partner: | Technische Universität Dresden (TUD) | |
Partner: | Fraunhofer Institute for Material and Beam Technology (IWS) | |
Location: | ZEU046 | |
Inventory number: | 25165049 |
Description
AFM operating principle
The Atomic force microscope is a tool to characterize mechanical (stiffness, friction), electrical (capacitance, electrostatic forces), magnetic and optical spectroscopic properties.
Therefore a cantilever/tip assembly interacts with the substrate through a raster scanning motion. The tip motion is monitored through the tracking of the laser light reflected off the back end of the cantilever, directed towards a position sensitive detector. By calibrating the deflection sensitivity, the AFM can achieve resolutions down to the nanometer scale. The shaker piezo provides the ability to oscillate the probe at a wide range of frequencies enabling dynamic modes of operation in the AFM.
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Last Update
Last updated at: 12 September 2018 at 11:47:59