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Atomic Force Microscope Nanosurf CoreAFM

Basic Information

Name: Atomic Force Microscope
Manufacturer: Nanosurf
Model: CoreAFM
Facility: Chair of Large Area Laser Based Surface Structuring (LMO)
Partner: Technische Universität Dresden (TUD)
Partner: Fraunhofer Institute for Material and Beam Technology (IWS)
Location: ZEU046
Inventory number: 25165049


AFM operating principle

The Atomic force microscope is a tool to characterize mechanical (stiffness, friction), electrical (capacitance, electrostatic forces), magnetic and optical spectroscopic properties.

Therefore a cantilever/tip assembly interacts with the substrate through a raster scanning motion. The tip motion is monitored through the tracking of the laser light reflected off the back end of the cantilever, directed towards a position sensitive detector. By calibrating the deflection sensitivity, the AFM can achieve resolutions down to the nanometer scale. The shaker piezo provides the ability to oscillate the probe at a wide range of frequencies enabling dynamic modes of operation in the AFM.

Link to Further Details


Points of Contact

Prof. Dr.-Ing. Andrés F. Lasagni / Mrs. Lisa Becher (Sec.)
+49 351 463-37844
+49 351 463-37755


Last Update

Last updated at: 12 September 2018 at 11:47:59