Atomic Force Microscope Nanosurf CoreAFM
|Name:||Atomic Force Microscope|
|Facility:||Chair of Large Area Laser Based Surface Structuring (LMO)|
|Partner:||Technische Universität Dresden (TUD)|
|Partner:||Fraunhofer Institute for Material and Beam Technology (IWS)|
AFM operating principle
The Atomic force microscope is a tool to characterize mechanical (stiffness, friction), electrical (capacitance, electrostatic forces), magnetic and optical spectroscopic properties.
Therefore a cantilever/tip assembly interacts with the substrate through a raster scanning motion. The tip motion is monitored through the tracking of the laser light reflected off the back end of the cantilever, directed towards a position sensitive detector. By calibrating the deflection sensitivity, the AFM can achieve resolutions down to the nanometer scale. The shaker piezo provides the ability to oscillate the probe at a wide range of frequencies enabling dynamic modes of operation in the AFM.
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Last updated at: 12 September 2018 at 11:47:59