View all instruments of this unit Critical Dimension Scanning Electron Microscope (CD-SEM) Applied Materials Verity Lite
Basic Information
| Name: | Critical Dimension Scanning Electron Microscope (CD-SEM) | |
| Manufacturer: | Applied Materials | |
| Model: | Verity Lite | |
| Facility: | 200 mm MEMS-Cleanroom | |
| Partner: | Fraunhofer Institute for Photonic Microsystems (IPMS) |
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| Inventory number: | MTR-CDS01 | |
Options of instrument usage
- This instrument is used within a service or research collaboration.
Points of Contact
Associated Services
| Name | Preview | Actions |
|---|---|---|
| Metrology and Inspection |
Last Update
Last updated at: 14 January 2025 at 14:25:28