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View all instruments of this unit CV Analysis Keithley, Keysight B1500, HP4294A, HP4295A, K590
Basic Information
| Name: | CV Analysis | |
| Manufacturer: | Keithley, Keysight | |
| Model: | B1500, HP4294A, HP4295A, K590 | |
| Facility: | 200 mm MEMS-Cleanroom | |
| Partner: | Fraunhofer Institute for Photonic Microsystems (IPMS) |
|
| Inventory number: | ANA-PROB01, WLR-PROB02 | |
Description
- Oxide thickness; flat band voltage; effective oxide charge; average bulk dop.; threshold voltage; Debye length; interface trap density (LF and HF-CV)
- Relaxation time; minority carrier lifetime; surface scan velocity (TVS, CV BTS)
Options of instrument usage
- This instrument is used within a service or research collaboration.
Points of Contact
Associated Services
| Name | Preview | Actions |
|---|---|---|
| Test of wafer |
Last Update
Last updated at: 14 January 2025 at 15:50:03