View all services of this unit Test of wafer
Basic Information
| Name: | Test of wafer | |
| Facility: | 200 mm MEMS-Cleanroom | |
| Partner: | Fraunhofer Institute for Photonic Microsystems (IPMS) |
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Description
Electrical testing of wafers is performed after the fabrication process to ensure the functionality and reliability of the integrated circuits. This testing involves using specialized equipment to measure electrical parameters and identify any defects or variations that could affect the performance of the final devices. We offer for example mixed signal Testing, parametric Test System and electro-optical Test System.
Types of Service
- This service is provided as a standard/ routine service without research activity.
- This service is provided as a research activity e.g. as a development or improvement of methods tools or within research collaborations.
Points of Contact
Associated Instruments
Last Update
Last updated at: 14 January 2025 at 15:45:19